Dae-Eun Kim
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Nanoscale , 2013, Advance Article
DOI: 10.1039/C3NR34029E, Paper
DOI: 10.1039/C3NR34029E, Paper
Hyun-Joon Kim, Kyeong Hee Kang, Dae-Eun Kim
Frictional force during AFM manipulation of a single ZnO nanowire placed on a silicon wafer was obtained. The friction coefficient was in the range of 0.05 to 0.1.
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Frictional force during AFM manipulation of a single ZnO nanowire placed on a silicon wafer was obtained. The friction coefficient was in the range of 0.05 to 0.1.
To cite this article before page numbers are assigned, use the DOI form of citation above.
The content of this RSS Feed (c) The Royal Society of Chemistry
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