High-Resolution Structural Characterization of Two Layered Aluminophosphates by Synchrotron Powder Diffraction and NMR Crystallographies

Boris Bouchevreau, Charlotte Martineau, Caroline Mellot-Draznieks, Alain Tuel, Matthew R. Suchomel, Julien Trébosc, Olivier Lafon, Jean-Paul Amoureux and Francis Taulelle

Chemistry of Materials

DOI: 10.1021/cm4004799

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