Friday, August 09, 2013

Comparative advantages and limitations of the basic metrology methods applied to the characterization of nanomaterials




Nanoscale , 2013, Advance Article

DOI: 10.1039/C3NR02372A, Review Article

Pavel Linkov, Mikhail Artemyev, Anton E. Efimov, Igor Nabiev

Methods for analysis and metrology of nanomaterials are discussed and their comparative advantages and limitations at the nanolevel are evaluated.

To cite this article before page numbers are assigned, use the DOI form of citation above.

The content of this RSS Feed (c) The Royal Society of Chemistry





Click for full article

No comments:

Post a Comment