Thursday, August 01, 2013

Direct Imaging of Charged Impurity Density in Common Graphene Substrates

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Nano Letters

DOI: 10.1021/nl4012529




Kristen M. Burson, William G. Cullen, Shaffique Adam, Cory R. Dean, K. Watanabe, T. Taniguchi, Philip Kim and Michael S. Fuhrer

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