Monday, August 12, 2013

Electric Stress-Induced Threshold Voltage Instability of Multilayer MoS2 Field Effect Transistors

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ACS Nano

DOI: 10.1021/nn402348r




Kyungjune Cho, Woanseo Park, Juhun Park, Hyunhak Jeong, Jingon Jang, Tae-Young Kim, Woong-Ki Hong, Seunghun Hong and Takhee Lee

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