Thursday, August 08, 2013

Nanoscale quantification of charge injection and transportation process in Si-nanocrystal based sandwiched structure

Nanoscale , 2013, Accepted Manuscript

DOI: 10.1039/C3NR03306F, Paper

Jie Xu, Jun Xu, Peng Zhan Zhang, Wei Li, Kun Ji Chen

Charge injection and transportation in silicon nanocrystals are characterized by joint analysis of KPFM and CAFM quantitatively at the nanoscale.

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