Wednesday, August 14, 2013

Patterned Defect Structures Predicted for Graphene Are Observed on Single-Layer Silica Films

TOC Graphic


Nano Letters

DOI: 10.1021/nl402264k




Bing Yang, Jorge Anibal Boscoboinik, Xin Yu, Shamil Shaikhutdinov and Hans-Joachim Freund

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