Structural and compositional properties of Er-doped silicon nanocluster/oxide for multilayered photonic devices studied by STEM-EELS.

Nanoscale , 2013, Accepted Manuscript

DOI: 10.1039/C3NR02754F, Paper

Alberto Eljarrat, Lluis Lopez-Conesa, Yonder Berencen, J. M Ramirez, Blas Garrido, Cesar Magen, Sonia Estrade, Francesca Peiro

High resolution scanning transmission electron microscopy in an aberration corrected and monochromated instrument has been used for the assessment of the silicon-based active layer stack for novel optoelectronic devices. This...

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