Wednesday, May 01, 2013

Atomic-scale chemical quantification of oxide interfaces using energy-dispersive X-ray spectroscopy

(author unknown)



Ping Lu, Jie Xiong, and Mark Van Benthem et al.

Atomic-scale quantification of chemical composition across oxide interfaces is important for understanding physical properties of epitaxial oxide nanostructures. Energy-dispersive X-ray spectroscopy (EDS) in an aberration-corrected scanning transmission electron microscope was used to quantify che ... [Appl. Phys. Lett. 102, 173111 (2013)] published Wed May 01, 2013.



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