Thursday, May 02, 2013

Optical Far-Field Method with Subwavelength Accuracy for the Determination of Nanostructure Dimensions in Large-Area Samples

Nicklas Anttu, Magnus Heurlin, Magnus T. Borgström, Mats-Erik Pistol, H. Q. Xu and Lars Samuelson



TOC Graphic


Nano Letters

DOI: 10.1021/nl400811q






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