Wednesday, May 01, 2013

On contribution and detection of higher eigenmodes during dynamic atomic force microscopy

(author unknown)



Govind Saraswat and Murti V. Salapaka

Dynamic mode operation of Atomic Force Microscopes relies on demodulation schemes to get information from different flexure modes of the cantilever while imaging a sample. In the article, we demonstrate that the conventional approach of discerning higher mode participation via amplitude and phase ... [Appl. Phys. Lett. 102, 173108 (2013)] published Wed May 01, 2013.



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